说明
FT-IR (EPI.BPSG,C.O)配置
无配置OEM 型号描述
The QS-300 is a bench top FT-IR system designed for the analysis of semiconductor material in Fabs and R&D facilities. It features high performance optics with maximum optical throughput, providing precise and accurate measurements in both reflection and transmission modes. The system also has an innovative sample compartment that can accommodate single wafers or slugs of 3 to 200mm, as well as non-standard shape and size silicon substrates. This makes it a versatile tool for analyzing a wide range of semiconductor materials.文件
无文件
ONTO / NANOMETRICS / ACCENT / BIO-RAD
QS-300
已验证
类别
Spectrometer / SIMS
上次验证： 26 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
115135
晶圆尺寸：
8"/200mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
QS-300
类别
Spectrometer / SIMS
上次验证： 26 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
115135
晶圆尺寸：
8"/200mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
FT-IR (EPI.BPSG,C.O)配置
无配置OEM 型号描述
The QS-300 is a bench top FT-IR system designed for the analysis of semiconductor material in Fabs and R&D facilities. It features high performance optics with maximum optical throughput, providing precise and accurate measurements in both reflection and transmission modes. The system also has an innovative sample compartment that can accommodate single wafers or slugs of 3 to 200mm, as well as non-standard shape and size silicon substrates. This makes it a versatile tool for analyzing a wide range of semiconductor materials.文件
无文件