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ONTO / NANOMETRICS / ACCENT / BIO-RAD QS1200
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD QS1200
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD QS1200
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD QS1200
说明
无说明
配置
FT-IR Spectrometer for up to 200mm Wafers, on FTS-175 Spectrometer, with Pike MappIR Scanning Stage
OEM 型号描述
The QS1200 is a desktop FTIR metrology tool designed for advanced semiconductor fabs. It is used for dopant monitoring, epi thickness measurement, and other applications. The tool can accommodate SEMI standard wafers of 100, 125, 150, 200, and 300mm diameter, as well as odd shaped wafer pieces and 2mm thick silicon slices. An optional single wafer mapping stage is available for all wafer sizes. The QS1200 also features unique algorithms for instant qualification of SOI, SiC, and other epitaxial films. Its built-in intelligence extends its applicability to almost every film material imaginable. Additionally, it is versatile enough to qualify the thickness of recycled test wafers for rapid payback. This tool provides a new level of integration of the FTIR technique utilizing proven optical technology.
文件

无文件

类别
Spectrometer / SIMS

上次验证: 60 多天前

物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

93672


晶圆尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

ONTO / NANOMETRICS / ACCENT / BIO-RAD

QS1200

verified-listing-icon
已验证
类别
Spectrometer / SIMS
上次验证: 60 多天前
listing-photo-22bfa37d98c34ffe80a40abdcf7a4222-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

93672


晶圆尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明
配置
FT-IR Spectrometer for up to 200mm Wafers, on FTS-175 Spectrometer, with Pike MappIR Scanning Stage
OEM 型号描述
The QS1200 is a desktop FTIR metrology tool designed for advanced semiconductor fabs. It is used for dopant monitoring, epi thickness measurement, and other applications. The tool can accommodate SEMI standard wafers of 100, 125, 150, 200, and 300mm diameter, as well as odd shaped wafer pieces and 2mm thick silicon slices. An optional single wafer mapping stage is available for all wafer sizes. The QS1200 also features unique algorithms for instant qualification of SOI, SiC, and other epitaxial films. Its built-in intelligence extends its applicability to almost every film material imaginable. Additionally, it is versatile enough to qualify the thickness of recycled test wafers for rapid payback. This tool provides a new level of integration of the FTIR technique utilizing proven optical technology.
文件

无文件