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IONTOF TOF.SIMS M6
    说明
    无说明
    配置
    -M6 High Performance Time‑of‑Flight Secondary Ion Mass Spectrometry System – Main unit of the M6 system. -Bake‑out Loadlock – In‑chamber baking system for the loadlock. -Nanoprobe 50 – Latest‑generation high‑performance BiMn cluster ion gun for high mass resolution surface spectroscopy, high lateral spatial resolution 2D/3D imaging, and high‑performance depth profiling. -DSC O₂/CS Dual Ion Source Optical Column – Electron‑bombardment gas ion source and thermal‑ionization Cs ion source; compatible with Nanoprobe 50 for depth profiling. -Auto Gas Flood System – Pressure‑controlled leak valve and nozzle for introducing trace gases onto the sample surface during analysis; automatic gas switching via Vacuum Control Unit (VCU). -Consumables – One‑year consumables package (slightly adjustable depending on configuration).
    OEM 型号描述
    未提供
    文件

    无文件

    verified-listing-icon

    已验证

    类别
    Spectrometer / SIMS

    上次验证: 2 天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    149098


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    IONTOF TOF.SIMS M6

    IONTOF

    TOF.SIMS M6

    Spectrometer / SIMS
    年份: 0状况: 二手
    上次验证2 天前

    IONTOF

    TOF.SIMS M6

    verified-listing-icon
    已验证
    类别
    Spectrometer / SIMS
    上次验证: 2 天前
    listing-photo-fd3d939ac59345b895842000268c599a-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    149098


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    -M6 High Performance Time‑of‑Flight Secondary Ion Mass Spectrometry System – Main unit of the M6 system. -Bake‑out Loadlock – In‑chamber baking system for the loadlock. -Nanoprobe 50 – Latest‑generation high‑performance BiMn cluster ion gun for high mass resolution surface spectroscopy, high lateral spatial resolution 2D/3D imaging, and high‑performance depth profiling. -DSC O₂/CS Dual Ion Source Optical Column – Electron‑bombardment gas ion source and thermal‑ionization Cs ion source; compatible with Nanoprobe 50 for depth profiling. -Auto Gas Flood System – Pressure‑controlled leak valve and nozzle for introducing trace gases onto the sample surface during analysis; automatic gas switching via Vacuum Control Unit (VCU). -Consumables – One‑year consumables package (slightly adjustable depending on configuration).
    OEM 型号描述
    未提供
    文件

    无文件

    类似上架物品
    查看全部
    IONTOF TOF.SIMS M6

    IONTOF

    TOF.SIMS M6

    Spectrometer / SIMS年份: 0状况: 二手上次验证:2 天前