说明
Monochromated Al + non-mono dual-source Al+Mg SAC 1.5x10to-9 Torr achievable and STC 10to-8 Torr Charge Neutralizer配置
Mono Al Ka (1486.6eV) -Sample sizes up to 2cm in diameter and up to 10mm thick -Load lock for fast sample interchange -Precision auto stage for multiple unattended sample analysis -Depth Profiling for multilayered thin film analysis -Variable angle sample orientation- angular dependent XPS -Sample heating (600C) and sample cooling (-150C) -Elemental imaging (min 200 µm x 200 µm) on selected samples -Small spot analysis (min 27µm) on selected samplesOEM 型号描述
Step into the future of imaging and small spot XPS with AXIS ULTRA, a trailblazing market leader that now boasts cutting-edge photoelectron detector technology. Experience a revolutionary blend of quantitative, real-time parallel imaging, and unparalleled high-resolution spectroscopy across all analysis areas. This next-generation system elevates the boundaries of possibility, offering an exceptional platform for your advanced research needs.文件
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KRATOS ANALYTICAL
AXIS ULTRA
已验证
类别
Spectrometer / SIMS
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
63898
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KRATOS ANALYTICAL
AXIS ULTRA
类别
Spectrometer / SIMS
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
63898
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Monochromated Al + non-mono dual-source Al+Mg SAC 1.5x10to-9 Torr achievable and STC 10to-8 Torr Charge Neutralizer配置
Mono Al Ka (1486.6eV) -Sample sizes up to 2cm in diameter and up to 10mm thick -Load lock for fast sample interchange -Precision auto stage for multiple unattended sample analysis -Depth Profiling for multilayered thin film analysis -Variable angle sample orientation- angular dependent XPS -Sample heating (600C) and sample cooling (-150C) -Elemental imaging (min 200 µm x 200 µm) on selected samples -Small spot analysis (min 27µm) on selected samplesOEM 型号描述
Step into the future of imaging and small spot XPS with AXIS ULTRA, a trailblazing market leader that now boasts cutting-edge photoelectron detector technology. Experience a revolutionary blend of quantitative, real-time parallel imaging, and unparalleled high-resolution spectroscopy across all analysis areas. This next-generation system elevates the boundaries of possibility, offering an exceptional platform for your advanced research needs.文件
无文件