说明
无说明配置
无配置OEM 型号描述
The JEM-3010 is an ultrahigh resolution analytical electron microscope that boasts a point resolution of 0.17nm. It’s a versatile tool in materials science and innovation, with the HT Version offering a specimen tilt of ±45°. Notable features include a microactive goniometer with motorized 5 axes, a directly coupled ion pump with a bakeout function for maintaining clean specimen environments, and computer-controlled data management and storage.文件
无文件
JEOL
JEM-3010
已验证
类别
TEM
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
69539
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
JEOL
JEM-3010
类别
TEM
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
69539
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
The JEM-3010 is an ultrahigh resolution analytical electron microscope that boasts a point resolution of 0.17nm. It’s a versatile tool in materials science and innovation, with the HT Version offering a specimen tilt of ±45°. Notable features include a microactive goniometer with motorized 5 axes, a directly coupled ion pump with a bakeout function for maintaining clean specimen environments, and computer-controlled data management and storage.文件
无文件