说明
FEI Tecnai G2 F30 TWIN 300kV FEG TEM配置
– FEI Tecnai G2 F30 TWIN 300 kV FEG Transmission Electron Microscope – Suitable for materials science, nanomaterials, and life sciences ** BEAM ** – Field emission gun (FEG) – Acceleration voltage: 300 kV ** RESOLUTION ** – Point resolution: 0.24 nm – Line resolution: 0.14 nm ** DETECTORS ** – Gatan UltraScan 4000 UHS MP (multi-port readout) for 300 kV ** STAGE ** – Single-tilt holder – Single-tilt tomography holder – Double-tilt holder – Five-axis motorized goniometer stage – Typical tilt range up to ±70 degrees with tomography holderOEM 型号描述
未提供文件
无文件
TECNAI
F20
类别
TEM
上次验证： 12 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
147194
晶圆尺寸：
未知
年份：
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
FEI Tecnai G2 F30 TWIN 300kV FEG TEM配置
– FEI Tecnai G2 F30 TWIN 300 kV FEG Transmission Electron Microscope – Suitable for materials science, nanomaterials, and life sciences ** BEAM ** – Field emission gun (FEG) – Acceleration voltage: 300 kV ** RESOLUTION ** – Point resolution: 0.24 nm – Line resolution: 0.14 nm ** DETECTORS ** – Gatan UltraScan 4000 UHS MP (multi-port readout) for 300 kV ** STAGE ** – Single-tilt holder – Single-tilt tomography holder – Double-tilt holder – Five-axis motorized goniometer stage – Typical tilt range up to ±70 degrees with tomography holderOEM 型号描述
未提供文件
无文件