跳至主要内容
Moov logo

Moov Icon
KLA / ADE ULTRAGAGE 9500
    说明
    无说明
    配置
    ASC 2000
    OEM 型号描述
    The ADE 9500 UltraGage is a benchmark in wafer geometry characterization, essential in device fabrication and silicon wafer manufacturing. It accurately measures thickness, flatness, bow/warp, and more, using noncontact methods with 10nm resolution, applicable to both patterned and polished wafers. This compact tool offers nondestructive control, with options for manual or cassette operation, and supports optional networking including SECS/GEM. Ideal for applications in photolithography, CMP, and other processes, the UltraGage is a versatile, high-performance metrology solution.
    文件

    无文件

    类别
    Thin Film / Film Thickness

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    Deinstalled


    产品编号:

    110933


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    KLA / ADE

    ULTRAGAGE 9500

    verified-listing-icon
    已验证
    类别
    Thin Film / Film Thickness
    上次验证: 60 多天前
    listing-photo-7d6c1ede96ce4fa59f6185f52ce5c618-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1893/7d6c1ede96ce4fa59f6185f52ce5c618/67c42fa75fc246a78e9d268f5ffbdc73_9dfe3f9c23e84195abee462cb2e75c241201a_mw.jpeg
    listing-photo-7d6c1ede96ce4fa59f6185f52ce5c618-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1893/7d6c1ede96ce4fa59f6185f52ce5c618/4daa3ce388014e87ac0d10f9e4df5a69_756c1bb89f0748939c4ad4a3a1cad0d41201a_mw.jpeg
    物品主要详细信息

    状况:

    Used


    运行状况:

    Deinstalled


    产品编号:

    110933


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    ASC 2000
    OEM 型号描述
    The ADE 9500 UltraGage is a benchmark in wafer geometry characterization, essential in device fabrication and silicon wafer manufacturing. It accurately measures thickness, flatness, bow/warp, and more, using noncontact methods with 10nm resolution, applicable to both patterned and polished wafers. This compact tool offers nondestructive control, with options for manual or cassette operation, and supports optional networking including SECS/GEM. Ideal for applications in photolithography, CMP, and other processes, the UltraGage is a versatile, high-performance metrology solution.
    文件

    无文件