说明
Critical Dimension (CD) Measurement (non SEM)配置
无配置OEM 型号描述
The Atlas III, Atlas II+, and Atlas XP/Atlas XP+ line of high-performance metrology systems providing optical critical dimension (“OCD”®), thin film metrology and wafer stress for transistor and interconnect metrology applications.文件
无文件
类别
Thin Film / Film Thickness
上次验证： 19 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
147775
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
ATLAS III
类别
Thin Film / Film Thickness
上次验证： 19 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
147775
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Critical Dimension (CD) Measurement (non SEM)配置
无配置OEM 型号描述
The Atlas III, Atlas II+, and Atlas XP/Atlas XP+ line of high-performance metrology systems providing optical critical dimension (“OCD”®), thin film metrology and wafer stress for transistor and interconnect metrology applications.文件
无文件