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ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 210
    说明
    good working condition, can demonstrate
    配置
    - Range of Thicknesses: 100 to 500,000 angstroms - Typical Measurement Time: 2.5 seconds. - Spot Size: 50 um with 5x objective 25 um with 10x objective 6.5 um with 40x objective - Film Types Measured: Oxide on Silicon Nitride on Silicon Negative Resist on Silicon Polysilicon on Oxide Negative Resist on Oxide Nitride on Oxide Polyimide on Silicon Positive Resist on Silicon Positive Resist on Oxide - Reflectance Mode: Thick Films - Reproducibility: 5A ± 5% depending upon the film type
    OEM 型号描述
    未提供
    文件

    无文件

    类别
    Thin Film / Film Thickness

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    66396


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 210

    verified-listing-icon
    已验证
    类别
    Thin Film / Film Thickness
    上次验证: 60 多天前
    listing-photo-20033ed8e5aa48c080257aac9286291d-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/45614/20033ed8e5aa48c080257aac9286291d/b8be142007e24accb96390683db2c7a1_a75284d8278149c79dbe1a0ab100e4241201a_mw.jpeg
    listing-photo-20033ed8e5aa48c080257aac9286291d-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/45614/20033ed8e5aa48c080257aac9286291d/776a94fce5584212871379fb0102c3a8_9d9e1343c4674fcfbdcb69a2222251531201a_mw.jpeg
    listing-photo-20033ed8e5aa48c080257aac9286291d-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/45614/20033ed8e5aa48c080257aac9286291d/d7feacc291b1415dbbb87a223d100ea6_f7c5f70d9d304ede96b2f8e0f1c945021201a_mw.jpeg
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    66396


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    good working condition, can demonstrate
    配置
    - Range of Thicknesses: 100 to 500,000 angstroms - Typical Measurement Time: 2.5 seconds. - Spot Size: 50 um with 5x objective 25 um with 10x objective 6.5 um with 40x objective - Film Types Measured: Oxide on Silicon Nitride on Silicon Negative Resist on Silicon Polysilicon on Oxide Negative Resist on Oxide Nitride on Oxide Polyimide on Silicon Positive Resist on Silicon Positive Resist on Oxide - Reflectance Mode: Thick Films - Reproducibility: 5A ± 5% depending upon the film type
    OEM 型号描述
    未提供
    文件

    无文件