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说明
good working condition, can demonstrate配置
- Range of Thicknesses: 100 to 500,000 angstroms - Typical Measurement Time: 2.5 seconds. - Spot Size: 50 um with 5x objective 25 um with 10x objective 6.5 um with 40x objective - Film Types Measured: Oxide on Silicon Nitride on Silicon Negative Resist on Silicon Polysilicon on Oxide Negative Resist on Oxide Nitride on Oxide Polyimide on Silicon Positive Resist on Silicon Positive Resist on Oxide - Reflectance Mode: Thick Films - Reproducibility: 5A ± 5% depending upon the film typeOEM 型号描述
未提供文件
无文件
类别
Thin Film / Film Thickness
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
66396
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 210
类别
Thin Film / Film Thickness
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
66396
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
good working condition, can demonstrate配置
- Range of Thicknesses: 100 to 500,000 angstroms - Typical Measurement Time: 2.5 seconds. - Spot Size: 50 um with 5x objective 25 um with 10x objective 6.5 um with 40x objective - Film Types Measured: Oxide on Silicon Nitride on Silicon Negative Resist on Silicon Polysilicon on Oxide Negative Resist on Oxide Nitride on Oxide Polyimide on Silicon Positive Resist on Silicon Positive Resist on Oxide - Reflectance Mode: Thick Films - Reproducibility: 5A ± 5% depending upon the film typeOEM 型号描述
未提供文件
无文件