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ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000X
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000X
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000X
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000X
说明
无说明
配置
无配置
OEM 型号描述
The NanoSpec 8000X is a versatile tool designed for the automated measurement of wafers ranging in size from 75mm to 200mm. It comes with a standard mechanical interface and can be equipped with mini-environment enclosures, making it suitable for use in ultra-clean manufacturing facilities. Additionally, the 8000X can be configured to handle substrates used in the magnetic recording head industry. With these features, the NanoSpec 8000X is a reliable and adaptable solution for a variety of wafer measurement needs.
文件

无文件

PREFERRED
 
SELLER
类别
Thin Film / Film Thickness

上次验证: 60 多天前

Buyer pays 12% premium of final sale price
物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

104217


晶圆尺寸:

未知


年份:

未知


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
 
SELLER

ONTO / NANOMETRICS / ACCENT / BIO-RAD

NANOSPEC 8000X

verified-listing-icon
已验证
类别
Thin Film / Film Thickness
上次验证: 60 多天前
listing-photo-6e57cba6809c4df58e87516439fb177e-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
Buyer pays 12% premium of final sale price
物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

104217


晶圆尺寸:

未知


年份:

未知


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明
配置
无配置
OEM 型号描述
The NanoSpec 8000X is a versatile tool designed for the automated measurement of wafers ranging in size from 75mm to 200mm. It comes with a standard mechanical interface and can be equipped with mini-environment enclosures, making it suitable for use in ultra-clean manufacturing facilities. Additionally, the 8000X can be configured to handle substrates used in the magnetic recording head industry. With these features, the NanoSpec 8000X is a reliable and adaptable solution for a variety of wafer measurement needs.
文件

无文件