说明
METROLOGY配置
8300 XSEOEM 型号描述
The NanoSpec 8300 is a film thickness measuring system designed by Nanometrics for the semiconductor industry. It is capable of handling both 200mm and 300mm diameter wafers. The system incorporates both a spectroscopic ellipsometer and spectrophotometer, enabling it to accurately measure and analyze virtually any dielectric film used in semiconductor manufacture today.文件
无文件
类别
Thin Film / Film Thickness
上次验证： 16 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
149426
晶圆尺寸：
8"/200mm, 12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 8300
类别
Thin Film / Film Thickness
上次验证： 16 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
149426
晶圆尺寸：
8"/200mm, 12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
METROLOGY配置
8300 XSEOEM 型号描述
The NanoSpec 8300 is a film thickness measuring system designed by Nanometrics for the semiconductor industry. It is capable of handling both 200mm and 300mm diameter wafers. The system incorporates both a spectroscopic ellipsometer and spectrophotometer, enabling it to accurately measure and analyze virtually any dielectric film used in semiconductor manufacture today.文件
无文件