说明
Thin Films measurement tool, 8300 XSE Film Thickness Analyzer, Semi Automatic loader (150, 200, and 300mm wafers)配置
无配置OEM 型号描述
Same as 8300X. Spectroscopic ellipsometer. The 8300XSE includes a fully integrated spectroscopic ellipsometer which expands the measurement capabilities of the basic product, especially in ultrathin and multiple film stack measurement applications.文件
无文件
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 8300XSE
已验证
类别
Thin Film / Film Thickness
上次验证： 14 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
116017
晶圆尺寸：
6"/150mm, 8"/200mm, 12"/300mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 8300XSE
类别
Thin Film / Film Thickness
上次验证： 14 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
116017
晶圆尺寸：
6"/150mm, 8"/200mm, 12"/300mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Thin Films measurement tool, 8300 XSE Film Thickness Analyzer, Semi Automatic loader (150, 200, and 300mm wafers)配置
无配置OEM 型号描述
Same as 8300X. Spectroscopic ellipsometer. The 8300XSE includes a fully integrated spectroscopic ellipsometer which expands the measurement capabilities of the basic product, especially in ultrathin and multiple film stack measurement applications.文件
无文件