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ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 9300
    说明
    Thin Film Thickness Measurement
    配置
    无配置
    OEM 型号描述
    The NanoSpec 9300 is a stand-alone, automated thin film measurement system that can handle both 200 and 300 millimeter diameter wafers. It can be configured with a DUV to NIR spectroscopic ellipsometer for ultrathin, multiple film stack, and DUV lithography measurement applications. Additionally, an FTIR option can be added to measure the thickness of epi-silicon. The system can also include a mini-environment enclosure and wafer load ports that are compatible with industry standards. The 9300 conforms to the new industry standards for 300 millimeter wafer handling automation and features a Windows NT software platform that conforms to the newly established SEMI user interface standard. The 9300 was developed using technologies from integrated film thickness systems, allowing for easy transfer of measurement recipes between integrated and stand-alone film metrology systems.
    文件

    无文件

    类别
    Thin Film / Film Thickness

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    115101


    晶圆尺寸:

    12"/300mm


    年份:

    2002


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 9300

    verified-listing-icon
    已验证
    类别
    Thin Film / Film Thickness
    上次验证: 60 多天前
    listing-photo-3569cd1d960e44348e5f93959fab2cf2-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/3569cd1d960e44348e5f93959fab2cf2/d69176a3204341e7bdbc1bb44b54a558_1_mw.png
    listing-photo-3569cd1d960e44348e5f93959fab2cf2-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/3569cd1d960e44348e5f93959fab2cf2/6029d60da40647809a45b92b554fb1ad_2_mw.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    115101


    晶圆尺寸:

    12"/300mm


    年份:

    2002


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Thin Film Thickness Measurement
    配置
    无配置
    OEM 型号描述
    The NanoSpec 9300 is a stand-alone, automated thin film measurement system that can handle both 200 and 300 millimeter diameter wafers. It can be configured with a DUV to NIR spectroscopic ellipsometer for ultrathin, multiple film stack, and DUV lithography measurement applications. Additionally, an FTIR option can be added to measure the thickness of epi-silicon. The system can also include a mini-environment enclosure and wafer load ports that are compatible with industry standards. The 9300 conforms to the new industry standards for 300 millimeter wafer handling automation and features a Windows NT software platform that conforms to the newly established SEMI user interface standard. The 9300 was developed using technologies from integrated film thickness systems, allowing for easy transfer of measurement recipes between integrated and stand-alone film metrology systems.
    文件

    无文件