说明
Wafer thickness measurement system配置
无配置OEM 型号描述
The FSM 413 by Frontier Semiconductor (FSM) is a specialized dimensional and topography metrology measurement system designed for non-contact wafer thickness and thin-film metrology.文件
无文件
类别
Thin Film / Film Thickness
上次验证： 4 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
153161
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
FSM / FRONTIER SEMICONDUCTOR
FSM 413
类别
Thin Film / Film Thickness
上次验证： 4 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
153161
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Wafer thickness measurement system配置
无配置OEM 型号描述
The FSM 413 by Frontier Semiconductor (FSM) is a specialized dimensional and topography metrology measurement system designed for non-contact wafer thickness and thin-film metrology.文件
无文件