说明
Room Temperature Thin Film Stress and Flatness Measurement System配置
MetrologyOEM 型号描述
Film stress and wafer bow measurement for wafers up to 300mm diameter. 2D/3D stress mapping standard. Semi-automated system with convenient wafer loading and retrieval.文件
无文件
类别
Thin Film / Film Thickness
上次验证： 6 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
146837
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
FSM / FRONTIER SEMICONDUCTOR
FSM-128L
类别
Thin Film / Film Thickness
上次验证： 6 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
146837
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Room Temperature Thin Film Stress and Flatness Measurement System配置
MetrologyOEM 型号描述
Film stress and wafer bow measurement for wafers up to 300mm diameter. 2D/3D stress mapping standard. Semi-automated system with convenient wafer loading and retrieval.文件
无文件