说明
无说明配置
无配置OEM 型号描述
A non-contact, corona-based silicon and oxide charge monitoring system configured for wafer-to-wafer cassette handling of 200 mm wafers. System measures electrical characteristics such as charge composition, interface quality, dielectric thickness, and charge contamination of semiconductors and dielectric films. Measurements performed with easy to use Windows NT-based software interface. An Offline Recipe Generator and Data Analysis package provides added remote recipe generation and data analysis capabilities.文件
无文件
类别
Thin Film / Film Thickness
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
111215
晶圆尺寸：
未知
年份：
1997
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KEITHLEY
Quantox 64000
类别
Thin Film / Film Thickness
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
111215
晶圆尺寸：
未知
年份：
1997
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
A non-contact, corona-based silicon and oxide charge monitoring system configured for wafer-to-wafer cassette handling of 200 mm wafers. System measures electrical characteristics such as charge composition, interface quality, dielectric thickness, and charge contamination of semiconductors and dielectric films. Measurements performed with easy to use Windows NT-based software interface. An Offline Recipe Generator and Data Analysis package provides added remote recipe generation and data analysis capabilities.文件
无文件