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demo attached.OEM 型号描述
Benchtop automated thickness measurement system with X-Y stage on air bearing for wafers up to 8” round and for square wafers up to 156mmx156mm. Solar Wafers QA and QC, Cost effective, compact metrology tool for R&D labs for all type of wafers and surfaces.文件
类别
Thin Film / Film Thickness
上次验证： 26 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
121040
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA / MICROSENSE
UltraMap-200B
类别
Thin Film / Film Thickness
上次验证： 26 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
121040
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available