说明
Film Thickness Measurement System配置
无配置OEM 型号描述
The Opti-Probe 7341XP is a thin-film and critical dimension (CD) metrology tool developed by Therma-Wave. It is an extension of their widely deployed Opti-Probe line of thin-film measurement tools and delivers a metrology solution for high-volume 65nm chip production that yields better precision and productivity than earlier generation Opti-Probes. The tool has demonstrated an improvement in performance for its customers’ most critical thin-film and optical CD applications by a factor of up to two times. It leverages Therma-Wave’s field-proven Series-7 Opti-Probe platform, which combines five distinct film measurement technologies needed to meet the increasingly complex demands of process control.文件
无文件
类别
Thin Film / Film Thickness
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
135229
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA / THERMA-WAVE
OP-7341XP
类别
Thin Film / Film Thickness
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
135229
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Film Thickness Measurement System配置
无配置OEM 型号描述
The Opti-Probe 7341XP is a thin-film and critical dimension (CD) metrology tool developed by Therma-Wave. It is an extension of their widely deployed Opti-Probe line of thin-film measurement tools and delivers a metrology solution for high-volume 65nm chip production that yields better precision and productivity than earlier generation Opti-Probes. The tool has demonstrated an improvement in performance for its customers’ most critical thin-film and optical CD applications by a factor of up to two times. It leverages Therma-Wave’s field-proven Series-7 Opti-Probe platform, which combines five distinct film measurement technologies needed to meet the increasingly complex demands of process control.文件
无文件