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KLA SpectraCD-XT
    说明
    无说明
    配置
    Model: SpectraCD-XTS+ N40~013
    OEM 型号描述
    In February 2006, KLA introduced the SpectraCD-XT—our fourth-generation of inline optical CD metrology systems for advanced patterning process control at the 90nm and 65nm nodes. SpectraCD-XT is a non-destructive dedicated CD and profile metrology system built on our high-throughput, production-proven Archer platform. The tool is the only high performance spectroscopic ellipsometry (SE)-based
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    KLA

    SpectraCD-XT

    verified-listing-icon

    已验证

    类别
    Thin Film / Film Thickness

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    14632


    晶圆尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    KLA SpectraCD-XT

    KLA

    SpectraCD-XT

    Thin Film / Film Thickness
    年份: 0状况: 二手
    上次验证60 多天前

    KLA

    SpectraCD-XT

    verified-listing-icon
    已验证
    类别
    Thin Film / Film Thickness
    上次验证: 60 多天前
    listing-photo-B1580su3y8x5voF6EpKuZ9uqvQ-5myxfWsN6KJEfRP4-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    14632


    晶圆尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    Model: SpectraCD-XTS+ N40~013
    OEM 型号描述
    In February 2006, KLA introduced the SpectraCD-XT—our fourth-generation of inline optical CD metrology systems for advanced patterning process control at the 90nm and 65nm nodes. SpectraCD-XT is a non-destructive dedicated CD and profile metrology system built on our high-throughput, production-proven Archer platform. The tool is the only high performance spectroscopic ellipsometry (SE)-based
    文件

    无文件

    类似上架物品
    查看全部
    KLA SpectraCD-XT

    KLA

    SpectraCD-XT

    Thin Film / Film Thickness年份: 0状况: 二手上次验证:60 多天前
    KLA SpectraCD-XT

    KLA

    SpectraCD-XT

    Thin Film / Film Thickness年份: 0状况: 二手上次验证:60 多天前