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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA UV-1280SE
    说明
    无说明
    配置
    Film Thickness Measurement
    OEM 型号描述
    The Prometrix UV-1280SE is a production thin film measurement system that combines dual-beam spectrophotometry and broadband spectroscopic ellipsometry. It can directly measure film thickness, refractive index, and extinction coefficient of single- and multi-layer thin film stacks simultaneously. The system is easy to use, lowers cost of ownership, and increases production efficiency. It is useful for both process control and advanced materials development.
    文件

    无文件

    KLA

    UV-1280SE

    verified-listing-icon

    已验证

    类别
    Thin Film / Film Thickness

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    103872


    晶圆尺寸:

    8"/200mm


    年份:

    2000


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    KLA UV-1280SE

    KLA

    UV-1280SE

    Thin Film / Film Thickness
    年份: 2000状况: 二手
    上次验证60 多天前

    KLA

    UV-1280SE

    verified-listing-icon
    已验证
    类别
    Thin Film / Film Thickness
    上次验证: 60 多天前
    listing-photo-0cd93579cdff4358b0419a23e2c767f0-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    103872


    晶圆尺寸:

    8"/200mm


    年份:

    2000


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    Film Thickness Measurement
    OEM 型号描述
    The Prometrix UV-1280SE is a production thin film measurement system that combines dual-beam spectrophotometry and broadband spectroscopic ellipsometry. It can directly measure film thickness, refractive index, and extinction coefficient of single- and multi-layer thin film stacks simultaneously. The system is easy to use, lowers cost of ownership, and increases production efficiency. It is useful for both process control and advanced materials development.
    文件

    无文件

    类似上架物品
    查看全部
    KLA UV-1280SE

    KLA

    UV-1280SE

    Thin Film / Film Thickness年份: 2000状况: 二手上次验证:60 多天前
    KLA UV-1280SE

    KLA

    UV-1280SE

    Thin Film / Film Thickness年份: 0状况: 二手上次验证:60 多天前
    KLA UV-1280SE

    KLA

    UV-1280SE

    Thin Film / Film Thickness年份: 0状况: 二手上次验证:30 多天前