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说明
N&K 3700 RT Metrology System Broadband spectrometry for film thickness on transparent substrates, including photomask reticles.配置
Spotsize: R = 50um, T < 400um The n&k 3700-RT automated system is designed for handling 5” or 6” square masks or up to 8” square samples. These systems can also be configured for transparent wafers. The n&k 3700-RT simultaneously determines thickness, and n and k in the spectral range of 190-1000nm and provide non-destructive, real time, high throughput measurements directly on the device. This system collects reflectance and transmission data (in the spectral range from 190-1000 nm) at the same point and encompasses advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system.OEM 型号描述
未提供文件
无文件
N & K
3700 RT
类别
Thin Film / Film Thickness
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
12889
晶圆尺寸：
8"/200mm
年份：
2004
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
N&K 3700 RT Metrology System Broadband spectrometry for film thickness on transparent substrates, including photomask reticles.配置
Spotsize: R = 50um, T < 400um The n&k 3700-RT automated system is designed for handling 5” or 6” square masks or up to 8” square samples. These systems can also be configured for transparent wafers. The n&k 3700-RT simultaneously determines thickness, and n and k in the spectral range of 190-1000nm and provide non-destructive, real time, high throughput measurements directly on the device. This system collects reflectance and transmission data (in the spectral range from 190-1000 nm) at the same point and encompasses advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system.OEM 型号描述
未提供文件
无文件