We value your privacy
We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. 阅读更多
说明
N&K 8000 CD Trench Depth & Thin film Measurement Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers配置
Working DUV - Vis - NIR: 190nm to 1000nm Reflectance, Polarized Analyzer Unit with spot size : 50 um Cognex Pattern Recognition Software Windows 7 Operating System S/W Version : 10.5.3.0 n&k's Thin Film Characterization S/W n&k's Standard Films Library Automated Wafer Loading/Unloading Assyst Loadport for 8" Wafers Computerized X-Y stage for full wafer mapping, and wafer alignment capability Z-stage to accommodate multiple substrate thickness SEMI and CE Certification Application : Simultaneously determines thickness, n and k of thin films including semiconductors ,dielectronic (SiO2, Si3N4),etc, Polymers (Photoresist, etc),and very thin metals - Thin Film : Film Thickness / n and k - OCD : Depth / CD / ProfileOEM 型号描述
未提供文件
无文件
N & K
8000-CD
类别
Thin Film / Film Thickness
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
21701
晶圆尺寸：
8"/200mm
年份：
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
N&K 8000 CD Trench Depth & Thin film Measurement Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers配置
Working DUV - Vis - NIR: 190nm to 1000nm Reflectance, Polarized Analyzer Unit with spot size : 50 um Cognex Pattern Recognition Software Windows 7 Operating System S/W Version : 10.5.3.0 n&k's Thin Film Characterization S/W n&k's Standard Films Library Automated Wafer Loading/Unloading Assyst Loadport for 8" Wafers Computerized X-Y stage for full wafer mapping, and wafer alignment capability Z-stage to accommodate multiple substrate thickness SEMI and CE Certification Application : Simultaneously determines thickness, n and k of thin films including semiconductors ,dielectronic (SiO2, Si3N4),etc, Polymers (Photoresist, etc),and very thin metals - Thin Film : Film Thickness / n and k - OCD : Depth / CD / ProfileOEM 型号描述
未提供文件
无文件