说明
无说明配置
无配置OEM 型号描述
An advanced automated optical metrology system from n&k Technology designed for non-destructive characterization and monitoring of thin film materials and semiconductor wafers文件
无文件
N & K
3300
类别
Thin Film / Film Thickness
上次验证： 3 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
153189
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
An advanced automated optical metrology system from n&k Technology designed for non-destructive characterization and monitoring of thin film materials and semiconductor wafers文件
无文件