说明
无说明配置
Olympus AL110-LMB6 plus Olympus MX50OEM 型号描述
The Olympus AL110-LMB86 is an automated wafer loader designed for use with the MX61 microscope. It belongs to the AL110 series of programmable wafer handlers, which are known for their cost-effectiveness and versatility. These features make them an ideal choice when a programmable wafer handler is needed to increase throughput. The AL110 series offers a range of formats, as well as non-contact optical wafer centering and notch detection. It also boasts high-throughput and is class 10 compatible, with a stainless steel facade that makes it suitable for use in clean rooms. Additionally, it can be integrated with an MX50 or MX80 via a manual or motorized shuttle stage, allowing for automated wafer inspections.文件
无文件
OLYMPUS
AL110-LMB86
已验证
类别
Wafer Handling
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
60426
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
OLYMPUS
AL110-LMB86
类别
Wafer Handling
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
60426
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
Olympus AL110-LMB6 plus Olympus MX50OEM 型号描述
The Olympus AL110-LMB86 is an automated wafer loader designed for use with the MX61 microscope. It belongs to the AL110 series of programmable wafer handlers, which are known for their cost-effectiveness and versatility. These features make them an ideal choice when a programmable wafer handler is needed to increase throughput. The AL110 series offers a range of formats, as well as non-contact optical wafer centering and notch detection. It also boasts high-throughput and is class 10 compatible, with a stainless steel facade that makes it suitable for use in clean rooms. Additionally, it can be integrated with an MX50 or MX80 via a manual or motorized shuttle stage, allowing for automated wafer inspections.文件
无文件