说明
BRUKER AXS TXS BRUKER AXS TXS配置
Material AnalysisOEM 型号描述
The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.文件
无文件
类别
X-Ray / XRD / XRF
上次验证： 16 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
143066
晶圆尺寸：
12"/300mm
年份：
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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BRUKER
D8 FABLINE
类别
X-Ray / XRD / XRF
上次验证： 16 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
143066
晶圆尺寸：
12"/300mm
年份：
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
BRUKER AXS TXS BRUKER AXS TXS配置
Material AnalysisOEM 型号描述
The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.文件
无文件