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BRUKER D8 FABLINE
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.
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    BRUKER

    D8 FABLINE

    verified-listing-icon

    已验证

    类别

    X-Ray
    上次验证: 60 多天前
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    24312


    晶圆尺寸:

    未知


    年份:

    2008

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    Money Back Guarantee
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    Transaction Insured by Moov
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    Refurbishment Services
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    BRUKER

    D8 FABLINE

    verified-listing-icon

    已验证

    类别

    X-Ray
    上次验证: 60 多天前
    listing-photo-dca3a81ef72f456895d195957b52f7c9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2336/dca3a81ef72f456895d195957b52f7c9/7d147b4052704eaa9a4a34a23576953a_screenshot20200721at7_f.png
    listing-photo-dca3a81ef72f456895d195957b52f7c9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2336/dca3a81ef72f456895d195957b52f7c9/de36872904b243c0a434bcabe5403998_screenshot20200721at7_f.png
    listing-photo-dca3a81ef72f456895d195957b52f7c9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2336/dca3a81ef72f456895d195957b52f7c9/65585ba8352d4facae8fa9e29c619e58_screenshot20200721at7_f.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    24312


    晶圆尺寸:

    未知


    年份:

    2008


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.
    文件

    无文件

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    查看全部
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