说明
Electron microscope配置
FOUP Factory Interface ETU Handler Main System Process: CDSEM Software Version: 14.3.0 CIM: SECS/GEMOEM 型号描述
Introduced in fiscal 2002, the NanoSEM 3D system extends CD-SEM technology beyond the measurement of critical dimensions to enable the three-dimensional imaging of chip features to more precisely control their lithography and etch processes.文件
无文件
类别
CD-SEM
上次验证： 5 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
154789
晶圆尺寸：
12"/300mm
年份：
2004
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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APPLIED MATERIALS (AMAT)
NANOSEM 3D
类别
CD-SEM
上次验证： 5 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
154789
晶圆尺寸：
12"/300mm
年份：
2004
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Electron microscope配置
FOUP Factory Interface ETU Handler Main System Process: CDSEM Software Version: 14.3.0 CIM: SECS/GEMOEM 型号描述
Introduced in fiscal 2002, the NanoSEM 3D system extends CD-SEM technology beyond the measurement of critical dimensions to enable the three-dimensional imaging of chip features to more precisely control their lithography and etch processes.文件
无文件