说明
SEM - Critical Dimension (CD) Measurement配置
无配置OEM 型号描述
CG5000 is designed to meet the needs for higher accuracy and versatility in development and manufacturing processes of new generation semiconductor devices. Hitachi High-Tech achieved new records*2 for throughput and metrology accuracy repeatability with the CG5000 by redesigning the transfer system and employing improved electron optics and image processing technologies.文件
无文件
HITACHI
CG5000
已验证
类别
CD-SEM
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
84403
晶圆尺寸：
12"/300mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
CG5000
已验证
类别
CD-SEM
上次验证： 25 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
84403
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
SEM - Critical Dimension (CD) Measurement配置
无配置OEM 型号描述
CG5000 is designed to meet the needs for higher accuracy and versatility in development and manufacturing processes of new generation semiconductor devices. Hitachi High-Tech achieved new records*2 for throughput and metrology accuracy repeatability with the CG5000 by redesigning the transfer system and employing improved electron optics and image processing technologies.文件
无文件