说明
无说明配置
Resolution 5nm, Repeatability 1%, CD range ≥0.1μm Original spec - 6 inch Si OF Modified spec - 4/6inch Si/ SiC (on tray)OEM 型号描述
S-8640 high-resolution critical-dimension measurement scanning electron microscopes (CD-SEMs) capable of handling 300-mm wafers.文件
无文件
HITACHI
S-8640
类别
CD-SEM
上次验证： 60 多天前
物品主要详细信息
状况：
Refurbished
运行状况:
未知
产品编号：
131709
晶圆尺寸：
4"/100mm, 6"/150mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
Resolution 5nm, Repeatability 1%, CD range ≥0.1μm Original spec - 6 inch Si OF Modified spec - 4/6inch Si/ SiC (on tray)OEM 型号描述
S-8640 high-resolution critical-dimension measurement scanning electron microscopes (CD-SEMs) capable of handling 300-mm wafers.文件
无文件