说明
CD-SEM配置
无配置OEM 型号描述
The S-9380 is Hitachi’s most advanced CD-measurement SEM developed for 65 nm process control of semiconductor devices on wafers up to 300 mm in diameter. With improvement in both hardware and software, the S-9380 supports a high throughput of 33 wafers per hour with 20 measurement points per wafer, and resolution of 2.0 nm.文件
无文件
HITACHI
S-9380
已验证
类别
CD-SEM
上次验证： 13 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
118475
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
S-9380
类别
CD-SEM
上次验证： 13 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
118475
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
CD-SEM配置
无配置OEM 型号描述
The S-9380 is Hitachi’s most advanced CD-measurement SEM developed for 65 nm process control of semiconductor devices on wafers up to 300 mm in diameter. With improvement in both hardware and software, the S-9380 supports a high throughput of 33 wafers per hour with 20 measurement points per wafer, and resolution of 2.0 nm.文件
无文件