说明
Metrology / inspection system配置
SEMVision G2 Robot Handler (Qty 2) FOUP Factory Interface Electronic Rack Process: Defect review sem Software Version: 5.4.500 CIM: SEC/GEMOEM 型号描述
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.文件
无文件
类别
Defect Inspection
上次验证： 5 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
154786
晶圆尺寸：
12"/300mm
年份：
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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APPLIED MATERIALS (AMAT)
SEMVISION G2
类别
Defect Inspection
上次验证： 5 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
154786
晶圆尺寸：
12"/300mm
年份：
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Metrology / inspection system配置
SEMVision G2 Robot Handler (Qty 2) FOUP Factory Interface Electronic Rack Process: Defect review sem Software Version: 5.4.500 CIM: SEC/GEMOEM 型号描述
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.文件
无文件