说明
-Tool is complete and software boots -Measurement, Board functionality -Laser inoperative配置
无配置OEM 型号描述
The Surfscan 6420 detects submicron defects on metal films and rough surfaces but still provides sensitivity down to 0.1 micron on polished silicon. It is effective for detecting defects on non-uniform films, a critical requirement for CMP applications.文件
无文件
KLA
SURFSCAN 6420
已验证
类别
Defect Inspection
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
68904
晶圆尺寸：
未知
年份：
1997
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA
SURFSCAN 6420
已验证
类别
Defect Inspection
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
68904
晶圆尺寸：
未知
年份：
1997
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
-Tool is complete and software boots -Measurement, Board functionality -Laser inoperative配置
无配置OEM 型号描述
The Surfscan 6420 detects submicron defects on metal films and rough surfaces but still provides sensitivity down to 0.1 micron on polished silicon. It is effective for detecting defects on non-uniform films, a critical requirement for CMP applications.文件
无文件