说明
Wafer defect detection Defect detection test配置
无配置OEM 型号描述
The KLA 2132 is an all pattern inspection model introduced by KLA, a company that produces inspection equipment for microprocessors, logic devices, and memory devices. It is part of the 2100 series and was introduced after the 2131 and before the 2135. Compared to its predecessor, the 2132 has greater sensitivity and maximum speed. The 2135, which was introduced in 1996, has twice the throughput and higher sensitivity compared to the 2132.文件
无文件
KLA
2132
已验证
类别
Defect Inspection
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
74957
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
2132
已验证
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
74957
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Wafer defect detection Defect detection test配置
无配置OEM 型号描述
The KLA 2132 is an all pattern inspection model introduced by KLA, a company that produces inspection equipment for microprocessors, logic devices, and memory devices. It is part of the 2100 series and was introduced after the 2131 and before the 2135. Compared to its predecessor, the 2132 has greater sensitivity and maximum speed. The 2135, which was introduced in 1996, has twice the throughput and higher sensitivity compared to the 2132.文件
无文件