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6" Fab For Sale from Moov - Click Here to Learn More
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KLA 2138
  • KLA 2138
  • KLA 2138
  • KLA 2138
说明
无说明
配置
Bright Field
OEM 型号描述
The KLA-2138 is an inline wafer inspection system that uses ultra-broadband technology to detect a wide range of yield-relevant defects on all process layers at high speeds. It features improved brightfield optics, Segmented Auto Threshold technology, and an ultra-broadband illumination source for increased sensitivity and faster setup times. An integrated SMIF minienvironment is also available to streamline automation and reduce fab cleanliness requirements.
文件

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KLA

2138

verified-listing-icon

已验证

类别
Defect Inspection

上次验证: 60 多天前

物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

107425


晶圆尺寸:

8"/200mm


年份:

2000


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

KLA

2138

verified-listing-icon
已验证
类别
Defect Inspection
上次验证: 60 多天前
listing-photo-d49745cda2d640eda96d688ba9512612-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

107425


晶圆尺寸:

8"/200mm


年份:

2000


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明
配置
Bright Field
OEM 型号描述
The KLA-2138 is an inline wafer inspection system that uses ultra-broadband technology to detect a wide range of yield-relevant defects on all process layers at high speeds. It features improved brightfield optics, Segmented Auto Threshold technology, and an ultra-broadband illumination source for increased sensitivity and faster setup times. An integrated SMIF minienvironment is also available to streamline automation and reduce fab cleanliness requirements.
文件

无文件