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KLA CANDELA CS900
    说明
    Surface Analyzer
    配置
    - Software version: 10.2.4.0101 - This is a CS900 running CS920 software -Tool powers on and initializes
    OEM 型号描述
    KLA / TENCOR Candela CS900 surface defect and EPI epitaxial defect inspection equipment is used for inspection and analysis of defects in Si silicon wafers and GaN epitaxial wafers, SiC substrates and SiC epitaxial wafers. Other applications for the Candela CS900 include EPI epitaxial defects, including particles, scratches, pits, pollution, traces, and PL function can also be added for detection some GaN EPI defects and SiC EPI defects. The device is compatible with transparent and opaque films.
    文件
    文件图标

    Candela CS 900.mov

    KLA

    CANDELA CS900

    verified-listing-icon

    已验证

    类别
    Defect Inspection

    上次验证： 30 多天前

    物品主要详细信息
    状况：

    Used

    运行状况:

    未知

    产品编号：

    90138

    晶圆尺寸：

    4"/100mm, 5"/125mm, 6"/150mm

    年份：

    2017

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    KLA CANDELA CS900

    KLA

    CANDELA CS900

    Defect Inspection
    年份： 2017状况： 二手
    上次验证30 多天前

    KLA

    CANDELA CS900

    verified-listing-icon
    已验证
    类别
    Defect Inspection
    上次验证： 30 多天前
    listing-photo-54ee853babee4b96a18ea548c92be66e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/54ee853babee4b96a18ea548c92be66e/d4da584ce58747398cacc75ee9648596_7037c292588b43ce999c7f57e490fa8d_mw.jpeg
    listing-photo-54ee853babee4b96a18ea548c92be66e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/54ee853babee4b96a18ea548c92be66e/20c26e0395794c888341511130170e18_d3d89809c40d424084775ee28123dc00_mw.jpeg
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    物品主要详细信息
    状况：

    Used

    运行状况:

    未知

    产品编号：

    90138

    晶圆尺寸：

    4"/100mm, 5"/125mm, 6"/150mm

    年份：

    2017

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Surface Analyzer
    配置
    - Software version: 10.2.4.0101 - This is a CS900 running CS920 software -Tool powers on and initializes
    OEM 型号描述
    KLA / TENCOR Candela CS900 surface defect and EPI epitaxial defect inspection equipment is used for inspection and analysis of defects in Si silicon wafers and GaN epitaxial wafers, SiC substrates and SiC epitaxial wafers. Other applications for the Candela CS900 include EPI epitaxial defects, including particles, scratches, pits, pollution, traces, and PL function can also be added for detection some GaN EPI defects and SiC EPI defects. The device is compatible with transparent and opaque films.
    文件
    文件图标

    Candela CS 900.mov

    类似上架物品
    查看全部
    KLA CANDELA CS900

    KLA

    CANDELA CS900

    Defect Inspection年份： 2017状况： 二手上次验证： 30 多天前