说明
Wafer Inspection System Details Attached配置
· Tencor 6100 Detection: 0.16 micron on Bare Silicon. · Red Laser 632 nm, matches 4500 data · Advanced Data output/GEM SECS · System Circuit Boards! · Tencor 6100OEM 型号描述
The Surfscan 6100 is a tool that is capable of detecting defects on a surface. It can locate, measure the size of, and count the number of defects that are as small as 0.157 micrometers in size. Additionally, it has a high capture rate of 95%, meaning it can accurately detect the vast majority of defects present on a surface.文件
无文件
类别
Defect Inspection
上次验证： 22 天前
物品主要详细信息
状况：
Used
运行状况:
Deinstalled
产品编号：
148640
晶圆尺寸：
4"/100mm, 6"/150mm, 8"/200mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
SURFSCAN 6100
类别
Defect Inspection
上次验证： 22 天前
物品主要详细信息
状况：
Used
运行状况:
Deinstalled
产品编号：
148640
晶圆尺寸：
4"/100mm, 6"/150mm, 8"/200mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Wafer Inspection System Details Attached配置
· Tencor 6100 Detection: 0.16 micron on Bare Silicon. · Red Laser 632 nm, matches 4500 data · Advanced Data output/GEM SECS · System Circuit Boards! · Tencor 6100OEM 型号描述
The Surfscan 6100 is a tool that is capable of detecting defects on a surface. It can locate, measure the size of, and count the number of defects that are as small as 0.157 micrometers in size. Additionally, it has a high capture rate of 95%, meaning it can accurately detect the vast majority of defects present on a surface.文件
无文件