说明
无说明配置
无配置OEM 型号描述
To help customers identify and fix these edge-related yield issues, KLA-Tencor introduced the VisEdge™ CV300, in October 2006. The tool’s unique optics design and advanced defect classification capabilities allow IC manufacturers to capture a wide range of wafer-edge defect types with high sensitivity.文件
无文件
KLA
VisEdge CV300
已验证
类别
Defect Inspection
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
66253
晶圆尺寸:
12"/300mm
年份:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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查看全部KLA
VisEdge CV300
已验证
类别
Defect Inspection
上次验证: 60 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
66253
晶圆尺寸:
12"/300mm
年份:
2007
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
To help customers identify and fix these edge-related yield issues, KLA-Tencor introduced the VisEdge™ CV300, in October 2006. The tool’s unique optics design and advanced defect classification capabilities allow IC manufacturers to capture a wide range of wafer-edge defect types with high sensitivity.文件
无文件