说明
无说明配置
Specification: Wafer Size: 300mm (200mm compatible) Objective Magnification: 2.5x / 10x / 20x / 50x / 100x / 150x Inspection Modes: Brightfield (BF), Darkfield (DF) Macro Inspection: Surface Macro, Center Backside Macro, Perimeter Backside Macro Load Port: 2 FOUP (Side or Rear selectable) Wafer Transfer: Robotic handling, Vacuum chuck, Non-contact pre-alignment Peripherals: HDD included, Mouse & KeyboardOEM 型号描述
OPTISTATION-3200 wafer inspection system文件
无文件
类别
Defect Inspection
上次验证： 4 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
142259
晶圆尺寸：
8"/200mm, 12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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NIKON
OPTISTATION-3200
类别
Defect Inspection
上次验证： 4 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
142259
晶圆尺寸：
8"/200mm, 12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
Specification: Wafer Size: 300mm (200mm compatible) Objective Magnification: 2.5x / 10x / 20x / 50x / 100x / 150x Inspection Modes: Brightfield (BF), Darkfield (DF) Macro Inspection: Surface Macro, Center Backside Macro, Perimeter Backside Macro Load Port: 2 FOUP (Side or Rear selectable) Wafer Transfer: Robotic handling, Vacuum chuck, Non-contact pre-alignment Peripherals: HDD included, Mouse & KeyboardOEM 型号描述
OPTISTATION-3200 wafer inspection system文件
无文件