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SEMILAB FAAST 230
    说明
    Rack of Powersupply is defective – Powersupply is ok Function is ok – not in production Tool on cleanroom floor 1 Palette of spares included: 2x Motion Controller (Newport MM3000) 1x DSP Lock-IN Amplifier 1x Robot Controller (Pri ESC-212) 1x Hot Chuck Temperatur Box (SDI) 1x Controller Activation Box (SDI) 1x Robot (Pri ATM-105-1-S) 1x Voltmeter (PDM-40a) 1x Voltmeter (PDM-60V) 1x Function Generator (Wafertek model 29) 1x Aligner (Brooks PRE-200) 2x Power Supply (Bertan 2341-1) 1x Box misc cable
    配置
    Mainframe
    OEM 型号描述
    The SEMILAB FAAST 230 is a non-contact, fast in-line monitoring system designed to detect heavy metal contamination, including sub 108 atoms/cm-3 Fe detection, in a medium to high-volume manufacturing environment. It features automated wafer handling, with options for SMIF/FOUP Loadport/Versaport, and can perform full wafer FAST mapping of diffusion length, Iron, and other recombination centers. The system is configurable for 100 mm to 300 mm wafers and is compatible with other Semilab SDI FAaST tool measurement technologies. Additional options include a minienvironment, wafer edge-grip handling, wafer flipper for automatic backsurface measurement, and more.
    文件

    无文件

    类别
    Defect Inspection

    上次验证: 昨天

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    113163


    晶圆尺寸:

    未知


    年份:

    2001


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    SEMILAB

    FAAST 230

    verified-listing-icon
    已验证
    类别
    Defect Inspection
    上次验证: 昨天
    listing-photo-8805276c587a4e32b240052622982cca-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53724/8805276c587a4e32b240052622982cca/49753ee3b3234c2db0fd59e40d32d3c0_ec6214ad4eed487a954d94477dbfbe6f45005c_mw.jpeg
    listing-photo-8805276c587a4e32b240052622982cca-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53724/8805276c587a4e32b240052622982cca/9e7148d28e0e49b086c3c97d9057135a_8cbdf3279f7541629470d68a1d389139_mw.png
    listing-photo-8805276c587a4e32b240052622982cca-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53724/8805276c587a4e32b240052622982cca/45c7fa46b2b7429481f3332f881dca38_c5cf96e4ac144095928e0945320fd1de_mw.png
    listing-photo-8805276c587a4e32b240052622982cca-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53724/8805276c587a4e32b240052622982cca/ce021c18a6ee4a178ef63424de41184c_68e9977c25b84a9c8edb2ea1452b89bd_mw.png
    listing-photo-8805276c587a4e32b240052622982cca-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53724/8805276c587a4e32b240052622982cca/62f6b759e1d34f689ef04cf5eb9ba51f_c2db1761b1cd48fa817da96443ca3172_mw.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    113163


    晶圆尺寸:

    未知


    年份:

    2001


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Rack of Powersupply is defective – Powersupply is ok Function is ok – not in production Tool on cleanroom floor 1 Palette of spares included: 2x Motion Controller (Newport MM3000) 1x DSP Lock-IN Amplifier 1x Robot Controller (Pri ESC-212) 1x Hot Chuck Temperatur Box (SDI) 1x Controller Activation Box (SDI) 1x Robot (Pri ATM-105-1-S) 1x Voltmeter (PDM-40a) 1x Voltmeter (PDM-60V) 1x Function Generator (Wafertek model 29) 1x Aligner (Brooks PRE-200) 2x Power Supply (Bertan 2341-1) 1x Box misc cable
    配置
    Mainframe
    OEM 型号描述
    The SEMILAB FAAST 230 is a non-contact, fast in-line monitoring system designed to detect heavy metal contamination, including sub 108 atoms/cm-3 Fe detection, in a medium to high-volume manufacturing environment. It features automated wafer handling, with options for SMIF/FOUP Loadport/Versaport, and can perform full wafer FAST mapping of diffusion length, Iron, and other recombination centers. The system is configurable for 100 mm to 300 mm wafers and is compatible with other Semilab SDI FAaST tool measurement technologies. Additional options include a minienvironment, wafer edge-grip handling, wafer flipper for automatic backsurface measurement, and more.
    文件

    无文件