说明
58173F LED Testing System配置
Measuring instrumentsOEM 型号描述
The Chroma 58173, in automatic operation, comes with unique design and a whole new method for LED total power measurement. In bare wafer/chip LED test production, partial flux correction of total flux is the common measurement method in LED epitaxy industry. (See Figure 3 on flip page) However, conventional method causes some disadvantages, i.e., lower accuracy, low S/N ratio, and slow test time etc., and which are difficult to be applied on LED bar wafer/chip total power/flux test production.文件
无文件
CHROMA
58173
类别
Electronic Test
上次验证： 13 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
149651
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
58173F LED Testing System配置
Measuring instrumentsOEM 型号描述
The Chroma 58173, in automatic operation, comes with unique design and a whole new method for LED total power measurement. In bare wafer/chip LED test production, partial flux correction of total flux is the common measurement method in LED epitaxy industry. (See Figure 3 on flip page) However, conventional method causes some disadvantages, i.e., lower accuracy, low S/N ratio, and slow test time etc., and which are difficult to be applied on LED bar wafer/chip total power/flux test production.文件
无文件