说明
无说明配置
无配置OEM 型号描述
Microspot Spectroscopic Ellipsometer Microspot spectroscopic ellipsometer of Semilab are capable of fully automated characterization of patterned, compound or (O)LED 300mm samples. Primary applications: - Front-end applications - Production wafer monitoring - Process development - Advanced Process Control: - Across wafer uniformity - Wafer to wafer uniformity - Batch to batch uniformity文件
SEMILAB
SE-3000
已验证
类别
Elipsometry
上次验证: 60 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
84893
晶圆尺寸:
12"/300mm
年份:
2004
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
SEMILAB
SE-3000
类别
Elipsometry
上次验证: 60 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
84893
晶圆尺寸:
12"/300mm
年份:
2004
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available