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SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
说明
无说明
配置
无配置
OEM 型号描述
Microspot Spectroscopic Ellipsometer Microspot spectroscopic ellipsometer of Semilab are capable of fully automated characterization of patterned, compound or (O)LED 300mm samples. Primary applications: - Front-end applications - Production wafer monitoring - Process development - Advanced Process Control: - Across wafer uniformity - Wafer to wafer uniformity - Batch to batch uniformity
文件
文件图标

SOPRA frame SE300.pdf

SEMILAB

SE-3000

verified-listing-icon

已验证

类别
Elipsometry

上次验证： 30 多天前

物品主要详细信息
状况：

Used

运行状况:

未知

产品编号：

84893

晶圆尺寸：

12"/300mm

年份：

2004

Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
类似上架物品
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SEMILAB SE-3000

SEMILAB

SE-3000

Elipsometry
年份： 2004状况： 二手
上次验证30 多天前

SEMILAB

SE-3000

verified-listing-icon
已验证
类别
Elipsometry
上次验证： 30 多天前
listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/a2cda83d16404a269edfdfe64a73056e_7a1abc1cab804d11b2363a26987355bd_mw.jpeg
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listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/b9267f7969884871a78fe9bc8f1a99f5_abb494cf22a74e4db4b590742119356a_mw.jpeg
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listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/865858dbd27a4d008e30feffac08e0f7_3c5ff27725794b228339e8975a2d824c1201a_mw.jpeg
物品主要详细信息
状况：

Used

运行状况:

未知

产品编号：

84893

晶圆尺寸：

12"/300mm

年份：

2004

Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明
配置
无配置
OEM 型号描述
Microspot Spectroscopic Ellipsometer Microspot spectroscopic ellipsometer of Semilab are capable of fully automated characterization of patterned, compound or (O)LED 300mm samples. Primary applications: - Front-end applications - Production wafer monitoring - Process development - Advanced Process Control: - Across wafer uniformity - Wafer to wafer uniformity - Batch to batch uniformity
文件
文件图标

SOPRA frame SE300.pdf

类似上架物品
查看全部
SEMILAB SE-3000

SEMILAB

SE-3000

Elipsometry年份： 2004状况： 二手上次验证：30 多天前