说明
Tester配置
512ch head(1), ws(PFU limited PDS-BX01E0335), ICUA(4, 517-426-01), Accessary(test jig&cable set)OEM 型号描述
The IP750EP is a powerful digital test system designed for the testing needs of CCD/CMOS image sensor devices. It features a 100 MHz digital test capability and supports CCD devices exceeding 10 Megapixels, as well as the digitized pixel capture function required of CMOS image sensors. With high-speed, multisite parallel testing capability up to 16 in parallel, the IP750EP helps to reduce test costs. The system also features IG-XL software, which combines the performance of the latest PC technology and Windows operating system with familiar Microsoft Windows® productivity tools (Microsoft Excel® and Visual Basic) to speed up program development. Overall, the IP750EP is a versatile and efficient solution for testing CCD/CMOS image sensor devices.文件
无文件
TERADYNE
IP750EP
已验证
类别
Final Test
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
95284
晶圆尺寸：
未知
年份：
2002
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
TERADYNE
IP750EP
类别
Final Test
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
95284
晶圆尺寸：
未知
年份：
2002
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Tester配置
512ch head(1), ws(PFU limited PDS-BX01E0335), ICUA(4, 517-426-01), Accessary(test jig&cable set)OEM 型号描述
The IP750EP is a powerful digital test system designed for the testing needs of CCD/CMOS image sensor devices. It features a 100 MHz digital test capability and supports CCD devices exceeding 10 Megapixels, as well as the digitized pixel capture function required of CMOS image sensors. With high-speed, multisite parallel testing capability up to 16 in parallel, the IP750EP helps to reduce test costs. The system also features IG-XL software, which combines the performance of the latest PC technology and Windows operating system with familiar Microsoft Windows® productivity tools (Microsoft Excel® and Visual Basic) to speed up program development. Overall, the IP750EP is a versatile and efficient solution for testing CCD/CMOS image sensor devices.文件
无文件