说明
Tester配置
TesterOEM 型号描述
The IP750Ex is a cost-effective image sensor test solution developed by Teradyne. It offers high throughput with dual core DSP and high speed data transfer at 10Gbps per instrument parallel, and can test up to 32 sites in parallel with 1024 digital pin configuration. It has broad device coverage, with the ability to test devices ranging from VGA to 32M pixels, and strong SOC test capability with the new HSD200 digital instrument. The IP750Ex is built on Teradyne’s J750 test platform, and is compatible with IP750EP/EMP test programs.文件
无文件
TERADYNE
IP750Ex
已验证
类别
Final Test
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
49044
晶圆尺寸：
未知
年份：
2001
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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TERADYNE
IP750Ex
类别
Final Test
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
49044
晶圆尺寸：
未知
年份：
2001
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Tester配置
TesterOEM 型号描述
The IP750Ex is a cost-effective image sensor test solution developed by Teradyne. It offers high throughput with dual core DSP and high speed data transfer at 10Gbps per instrument parallel, and can test up to 32 sites in parallel with 1024 digital pin configuration. It has broad device coverage, with the ability to test devices ranging from VGA to 32M pixels, and strong SOC test capability with the new HSD200 digital instrument. The IP750Ex is built on Teradyne’s J750 test platform, and is compatible with IP750EP/EMP test programs.文件
无文件