说明
12 Slot Test-Head xW8400 (can be upgraded to Z800) Esmo Orion Manipulator 2x DC90 2x DC30 4x HSD200 1x HVD 2x BBAC 1x VHFAC Customized reconfiguration will be supported配置
无配置OEM 型号描述
The microFLEX test system is a smaller version of the FLEX test system, with a zero-footprint “tester in a test head” design. It is well-suited for consumer, wireless, and automotive device testing, and its small size makes it ideal for installations with limited floor space. The microFLEX system offers cost-efficient testing up to 200 MHz and is ideal for analog, digital, and mixed-signal System-on-a-Chip (SoC) and System-in-Package (SiP) device testing applications. It has a broad range of instruments to choose from and offers instrument and DIB compatibility with the FLEX test system. The system’s smaller air-cooled test head has 12 universal slots to accommodate a range of instruments and can easily be reconfigured for different test strategies. An optional small-footprint 19” rack cabinet accommodates third-party instruments, such as those used in microwave test applications. The small footprint of the microFLEX system saves floor space as system resources such as the power distribution unit, test computer, and clock reference are located in the test head itself, eliminating the need for a separate mainframe cabinet.文件
无文件
TERADYNE
microFLEX
已验证
类别
Final Test
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
82931
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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TERADYNE
microFLEX
类别
Final Test
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
82931
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
12 Slot Test-Head xW8400 (can be upgraded to Z800) Esmo Orion Manipulator 2x DC90 2x DC30 4x HSD200 1x HVD 2x BBAC 1x VHFAC Customized reconfiguration will be supported配置
无配置OEM 型号描述
The microFLEX test system is a smaller version of the FLEX test system, with a zero-footprint “tester in a test head” design. It is well-suited for consumer, wireless, and automotive device testing, and its small size makes it ideal for installations with limited floor space. The microFLEX system offers cost-efficient testing up to 200 MHz and is ideal for analog, digital, and mixed-signal System-on-a-Chip (SoC) and System-in-Package (SiP) device testing applications. It has a broad range of instruments to choose from and offers instrument and DIB compatibility with the FLEX test system. The system’s smaller air-cooled test head has 12 universal slots to accommodate a range of instruments and can easily be reconfigured for different test strategies. An optional small-footprint 19” rack cabinet accommodates third-party instruments, such as those used in microwave test applications. The small footprint of the microFLEX system saves floor space as system resources such as the power distribution unit, test computer, and clock reference are located in the test head itself, eliminating the need for a separate mainframe cabinet.文件
无文件