说明
FEI FIB 800 Focused Ion Beam (FIB) System Does not include GIS Missing molecular pump And the controller.配置
Configuration: ISA Interface Joystick Oil pump Hard Disk Drive (HDD) I-Gun: Type: Prelens column Beam current: 1 pA - 11 nA Vacuum types: Mechanical pump Ion getter pump Stage type: Motor stage for XL50, 8" Type: Load lock Detector: CDEM Operating system: MS Windows NTOEM 型号描述
The FEI FIB 800 is a state-of-the-art Focused Ion Beam (FIB) system that is utilized for a variety of applications, including circuit editing, defect and failure analysis, TEM lamella preparation, nanofabrication, nanoprototyping, and MEMS. It employs a Magnum ion column and boasts a milling power of 21nA beam current. The system can accommodate samples with diameters up to 200mm and features a 5-axis motorized eucentric tilt stage. Additionally, it includes a gas injection system with up to four injectors and a vacuum system with column IGP, air-cooled Turbo, and mechanical PVP.文件
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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
FIB 800
已验证
类别
Inspection Equipment
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
Deinstalled
产品编号：
106614
晶圆尺寸：
8"/200mm
年份：
1996
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
FIB 800
类别
Inspection Equipment
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
Deinstalled
产品编号：
106614
晶圆尺寸：
8"/200mm
年份：
1996
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
FEI FIB 800 Focused Ion Beam (FIB) System Does not include GIS Missing molecular pump And the controller.配置
Configuration: ISA Interface Joystick Oil pump Hard Disk Drive (HDD) I-Gun: Type: Prelens column Beam current: 1 pA - 11 nA Vacuum types: Mechanical pump Ion getter pump Stage type: Motor stage for XL50, 8" Type: Load lock Detector: CDEM Operating system: MS Windows NTOEM 型号描述
The FEI FIB 800 is a state-of-the-art Focused Ion Beam (FIB) system that is utilized for a variety of applications, including circuit editing, defect and failure analysis, TEM lamella preparation, nanofabrication, nanoprototyping, and MEMS. It employs a Magnum ion column and boasts a milling power of 21nA beam current. The system can accommodate samples with diameters up to 200mm and features a 5-axis motorized eucentric tilt stage. Additionally, it includes a gas injection system with up to four injectors and a vacuum system with column IGP, air-cooled Turbo, and mechanical PVP.文件
无文件