说明
No missing parts配置
无配置OEM 型号描述
The Thermo Scientific Helios NanoLab 1200AT DualBeam can create site-specific transmission electron microscope (TEM) samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter. An optional Automated FOUP Loader (AFL) allows the system to be located inside the semiconductor wafer fab, where it can deliver critical information up to three times faster than laboratory-based analysis.文件
无文件
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 1200AT
已验证
类别
Inspection Equipment
上次验证： 22 天前
物品主要详细信息
状况：
Used
运行状况:
Installed / Running
产品编号：
114236
晶圆尺寸：
未知
年份：
2012
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 1200AT
类别
Inspection Equipment
上次验证： 22 天前
物品主要详细信息
状况：
Used
运行状况:
Installed / Running
产品编号：
114236
晶圆尺寸：
未知
年份：
2012
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
No missing parts配置
无配置OEM 型号描述
The Thermo Scientific Helios NanoLab 1200AT DualBeam can create site-specific transmission electron microscope (TEM) samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter. An optional Automated FOUP Loader (AFL) allows the system to be located inside the semiconductor wafer fab, where it can deliver critical information up to three times faster than laboratory-based analysis.文件
无文件