说明
Focused Ion Beam (FIB)配置
无配置OEM 型号描述
The Helios NanoLab 400 is a DualBeam system that integrates both ion and electron beams for Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) functionality in one machine. This allows users to switch between the two beams for quick and accurate navigation and milling. The convergence of the SEM and FIB at a short working distance enables precision “slice-and-view” cross-sectioning and analysis at high resolution. This system provides a powerful tool for sample preparation and analysis.文件
无文件
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 400
已验证
类别
Inspection Equipment
上次验证： 18 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
94797
晶圆尺寸：
12"/300mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 400
类别
Inspection Equipment
上次验证： 18 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
94797
晶圆尺寸：
12"/300mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Focused Ion Beam (FIB)配置
无配置OEM 型号描述
The Helios NanoLab 400 is a DualBeam system that integrates both ion and electron beams for Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) functionality in one machine. This allows users to switch between the two beams for quick and accurate navigation and milling. The convergence of the SEM and FIB at a short working distance enables precision “slice-and-view” cross-sectioning and analysis at high resolution. This system provides a powerful tool for sample preparation and analysis.文件
无文件