说明
无说明配置
无配置OEM 型号描述
The Helios NanoLab 400S is a DualBeam system from FEI that integrates both ion and electron beams for FIB (Focused Ion Beam) and SEM (Scanning Electron Microscopy) functionality in one machine. This allows users to switch between the two beams for quick and accurate navigation and milling. The convergence of the SEM and FIB at short working distance enables precision “slice-and-view” cross-sectioning and analysis at high resolution.文件
无文件
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 400S
已验证
类别
Inspection Equipment
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
74640
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 400S
类别
Inspection Equipment
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
74640
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
The Helios NanoLab 400S is a DualBeam system from FEI that integrates both ion and electron beams for FIB (Focused Ion Beam) and SEM (Scanning Electron Microscopy) functionality in one machine. This allows users to switch between the two beams for quick and accurate navigation and milling. The convergence of the SEM and FIB at short working distance enables precision “slice-and-view” cross-sectioning and analysis at high resolution.文件
无文件