说明
Epi Metrology & Testers配置
Software Version: Carmel Version 2015.3.8300 / Lynx Version 2.15.3.8300 Lasers: 355nm and 488nm Process: Photoluminescence on InGaN or AlInGaP LED wafers Spare Parts: Potentially some available PL SystemOEM 型号描述
Imperia is a photoluminescence (“PL”) full wafer imaging and mapping system designed for high-volume compound semiconductor metrology applications including power control and photonics applications adding significant inspection and substrate metrology capability to the established PL fleet.文件
无文件
类别
Metrology
上次验证： 17 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
134571
晶圆尺寸：
6"/150mm
年份：
2018
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
IMPERIA
类别
Metrology
上次验证： 17 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
134571
晶圆尺寸：
6"/150mm
年份：
2018
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Epi Metrology & Testers配置
Software Version: Carmel Version 2015.3.8300 / Lynx Version 2.15.3.8300 Lasers: 355nm and 488nm Process: Photoluminescence on InGaN or AlInGaP LED wafers Spare Parts: Potentially some available PL SystemOEM 型号描述
Imperia is a photoluminescence (“PL”) full wafer imaging and mapping system designed for high-volume compound semiconductor metrology applications including power control and photonics applications adding significant inspection and substrate metrology capability to the established PL fleet.文件
无文件