说明
Wafer Characterization配置
无配置OEM 型号描述
Imperia is a photoluminescence (“PL”) full wafer imaging and mapping system designed for high-volume compound semiconductor metrology applications including power control and photonics applications adding significant inspection and substrate metrology capability to the established PL fleet.文件
无文件
ONTO / NANOMETRICS / ACCENT / BIO-RAD
IMPERIA
已验证
类别
Metrology
上次验证： 15 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
116288
晶圆尺寸：
8"/200mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
IMPERIA
类别
Metrology
上次验证： 15 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
116288
晶圆尺寸：
8"/200mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Wafer Characterization配置
无配置OEM 型号描述
Imperia is a photoluminescence (“PL”) full wafer imaging and mapping system designed for high-volume compound semiconductor metrology applications including power control and photonics applications adding significant inspection and substrate metrology capability to the established PL fleet.文件
无文件